Normal view MARC view ISBD view

Semiconductor memories: technology, testing and reliability

Sharma, Ashok K.

Semiconductor memories: technology, testing and reliability Ashok K. Sharma - New Delhi Prentice-Hall 2000 - xii,462

ISBN: 8120316835

Subjects--Topical Terms:
Computer Storage devices

Dewey Class. No.: 621.39732 / SHA P0

Place hold
Print
Add to your cart (remove)
Save record
BIBTEX Dublin Core MARCXML MARC (non-Unicode/MARC-8) MARC (Unicode/UTF-8) MARC (Unicode/UTF-8, Standard) MODS (XML) RIS ISBD
More searches

Search for this title in:
Other Libraries (WorldCat) Other Databases (Google Scholar) Online Stores (Bookfinder.com) Open Library (openlibrary.org)