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Fault- tolerance and reliability techniques for high density random-access memories

Chakraborty, Kanad

Fault- tolerance and reliability techniques for high density random-access memories Kanad Chakraborty, Pinaki Mazumdar - Low price - Delhi Pearson Education (Singapore) 2002 - xix, 426

Includes bibliographical references and Index

ISBN: 8178087693

Subjects--Topical Terms:
Computer storage devices-Technique
Computer storage devices-Testing

Dewey Class. No.: 621.3973 / CHA P2

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