Fault- tolerance and reliability techniques for high density random-access memories Kanad Chakraborty, Pinaki Mazumdar

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TextLanguage: English Publication details: Delhi Pearson Education (Singapore) 2002Edition: Low priceDescription: xix, 426ISBN:

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Holdings
Item type	Current library	Call number	Status	Notes	Date due	Barcode
Books	Deen Dayal Upadhyaya College Library Reference	621.3973 CHA P2 (Browse shelf(Opens below))	Not for loan	SC 311		27236

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Previous	621.3950285526 SLA P6 Microprocessor-based design: a Comprehensive guide to hardware design	621.39507 ROB P11 Making things move: Div mechanism for inventors, hobbysits, and artists	621.395076 JAI P9 Digital electronics and microprocesses: problems and solutions	621.3973 CHA P2 Fault- tolerance and reliability techniques for high density random-access memories	621.39732 LEE P7 The design of CMOS radio frequency integrated circuits	621.39768 SHA P14 Advanced semiconductor memories: architectures, design, and applications	621.3981 AGR P11 Introduction to Wireless and Mobile Systems	Next

Includes bibliographical references and Index

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