Chakraborty, Kanad <br/><br/>
Fault- tolerance and reliability techniques for high density random-access memories 
Kanad Chakraborty, Pinaki Mazumdar 
 - Low price 
 - Delhi  Pearson Education (Singapore)  2002 
 - xix, 426 
<br/><br/> Includes bibliographical references and Index 
<br/><br/><label>ISBN: </label>8178087693 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Computer storage devices-Technique<br/>Computer storage devices-Testing
<br/><br/><label>Dewey Class. No.: </label>621.3973  / CHA P2