| 000 | 00632nam a2200217Ia 4500 | ||
|---|---|---|---|
| 008 | 230515s9999||||xx |||||||||||||| ||und|| | ||
| 020 | _a9780070153821 | ||
| 040 | _aMAIN | ||
| 041 | _aEnglish | ||
| 082 |
_a621.3815 _bHAY P10:P12 |
||
| 100 | _aHayt, William H. | ||
| 245 | 0 |
_aEngineering circuit analysis _cWilliam H. Hayt, Jack E. Kemmerly, Steven M. Durbin |
|
| 250 | _a7th | ||
| 260 |
_aNew Delhi _bTata McGraw Hill Education _c2010:2012 |
||
| 300 | _axxiv, 738 | ||
| 500 | _aIncludes index | ||
| 650 | _aElectric circuit analysis | ||
| 650 | _aElectric engineering-Testing | ||
| 700 | _aKemmerly, Jack E. | ||
| 942 | _cBK | ||
| 999 |
_c5697 _d5697 |
||