| 000 | 00591nam a2200217Ia 4500 | ||
|---|---|---|---|
| 008 | 230515s9999||||xx |||||||||||||| ||und|| | ||
| 020 | _a9780470873779 | ||
| 040 | _aMAIN | ||
| 041 | _aEnglish | ||
| 082 |
_a621.3815 _bIRW P11:P13 |
||
| 100 | _aIrwin, J. David | ||
| 245 | 0 |
_aEngineering Circuit analysis _cJ. David Irwin, R. Mark Nelms |
|
| 250 | _a10th | ||
| 260 |
_aHoboken, NJ _bJohn Wiley _c2011:2013 |
||
| 300 | _axv, 839 | ||
| 500 | _aIncludes index | ||
| 650 | _aElectric Circuit analysis | ||
| 650 | _aElectric engineering-Testing | ||
| 700 | _aNelms, R. Mark | ||
| 942 | _cBK | ||
| 999 |
_c5698 _d5698 |
||